ACM SIGMICRO

The MICRO Test of Time (ToT) award recognizes the most influential papers published in prior sessions of the International Symposium on Microarchitecture®. Two winners were selected for 2022:

• Runtime Power Monitoring in High-End Processors: Methodology and Empirical Data (MICRO 2003)
  Canturk Isci, Margaret Martonosi
• A Systematic Methodology to Compute the Architectural Vulnerability Factors for a High-Performance Microprocessor (MICRO 2003)
  Shubhendu S. Mukherjee, Christopher T. Weaver, Joel S. Emer, Steven K. Reinhardt, Todd M. Austin

Congratulations to the winners! You can read brief citations about the impact and significance of each paper on the MICRO website.