ACM SIGMICRO

The MICRO Test of Time (ToT) award recognizes the most influential papers published in prior sessions of the International Symposium on Microarchitecture®. Two papers were selected for 2025:

• Die Stacking (3D) Microarchitecture (MICRO 2006)
  Bryan Black, Murali Annavaram, Ned Brekelbaum, John DeVale, Lei Jiang, Gabriel H. Loh, Don McCauley, Pat Morrow, Donald W. Nelson, Daniel Pantuso, Paul Reed, Jeff Rupley, Sadasivan Shankar, John Shen, Clair Webb
• Optimizing NUCA Organizations and Wiring Alternatives for Large Caches with CACTI 6.0 (MICRO 2007)
  Naveen Muralimanohar, Rajeev Balasubramonian, Norman P. Jouppi

Congratulations to the winners! You can read brief citations about the impact and significance of their papers.